Δημοσιεύσεις

Διεθνή Περιοδικά (με κρίση)

  1. V. Gerakis, Y. Tsiatouhas and A.  Hatzopoulos, “A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs”, Springer, Journal of Electronic Testing: Theory and Applications, vol. 37, pp. 191-203, 2021.
  2. H-M. Dounavi, S. Sfikas and Y. Tsiatouhas, “Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier”, Springer, Journal of Electronic Testing: Theory and Applications, vol. 37, pp. 65-82, 2021.
  3. H-M. Dounavi, S. Sfikas and Y. Tsiatouhas, “Periodic Monitoring of BTI Induced Aging in SRAM Sense Amplifiers”, IEEE Transactions on Device and Materials Reliability, vol. 19, no. 1, pp. 64-72, 2019.
  4. Tenentes, Vasileios, Rossi, Daniele, K. Chakrabarty, B. M. Al-Hashimi, (2017) Leakage Current Analysis for Diagnosis of Power Gated Designs with Bridge Defect,IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. PP, no. 99, pp. 1-1.
  5. J. Liaperdos, A. Arapoyanni and Y. Tsiatouhas, “State Reduction for Efficient Digital Calibration of Analog/RF Integrated Circuits,” Springer, Analog Integrated Circuits and Signal Processing, vol. 90, no. 1, pp. 65-79, 2017.
  6. Daniele Rossi, Vasileios Tenentes, S. M. Reddy and B. M. Al-Hashimi, H. A. Brown, (2017) Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories, in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. PP, no. 99, pp. 1-1.
  7. D. Gutierrez, Mauricio Tenentes, Vasileios, D. Rossi, Kazmierski, Tom J., (2017) Susceptible Workload Evaluation and Protection using Selective Fault Tolerance, Journal of Electronic Testing, Springer.
  8. Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir (2016) Aging benefits in nanometer CMOS designs. IEEE Transactions on Circuits and Systems II Express Briefs, doi: 10.1109/TCSII.2016.2561206.
  9. S. Sfikas and Y. Tsiatouhas, “Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs”, IEEE Transactions on Computers, vol. 65, no.7, pp. 2339-2345, 2016.
  10. S. Valadimas, Y. Tsiatouhas and A. Arapoyanni, “Timing Error Tolerance in Small Core Designs for SoC Applications,” IEEE Transactions on Computers, vol. 65, no. 2, pp. 654-663, 2016.
  11. Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M. and Gunn, Steve R. (2016) Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, accepted.
  12. Halak, Basel, Tenentes, Vasileios, Rossi, Daniele, (2016) The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology, Microelectronics Reliability, Elsevier,\\doi:10.1016/j.microrel.2016.10.018, early access.
  13. K. Katsarou and Y. Tsiatouhas, “Soft Error Interception Latch: A Double Node Charge Sharing SEU Tolerant Design,” IET Electronics Letters, vol. 51, no. 4, pp. 330-332, 2015.
  14. Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir (2015) Reliable power gating with NBTI aging benefits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 24, no. 8, pp. 2735-2744.
  15. Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M. (2015) DFT architecture with power-distribution-network consideration for delay-based power gating test. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 34, no. 12, pp. 2013-2024.
  16. S. Matakias, Y. Tsiatouhas, A. Arapoyanni and Th. Haniotakis, “A Current Monitoring Technique for IDDQ Testing in Digital Integrated Circuits,” Elsevier, Integration the VLSI Journal, vol. 50, no. 1, pp. 48-60, 2015.
  17. E. Arvaniti and Y. Tsiatouhas, “Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique,” Springer, Journal of Electronic Testing: Theory and Applications, vol. 30, pp. 329-341, 2014.
  18. R. Wang, Z. Zhang, X. Kavousianos, Y. Tsiatouhas and K. Chakrabarty, “Built-In Self-Test, Diagnosis and Repair of Multi-Mode Power Switches,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 33, no. 8, pp. 1231-1244, 2014.
  19. S. Sfikas, Y. Tsiatouhas and S. Hamdioui, “Layout-Based Refined NPSF Model for DRAM Characterization and Testing”,IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 22, no. 6, pp. 1446-1450, 2014.
  20. S. Valadimas, A. Floros, Y. Tsiatouhas, A. Arapoyanni and X. Kavousianos, “The Time Dilation Technique for Timing Error Tolerance,” IEEE Transactions on Computers, vol. 63, no. 05, pp. 1277-1286, 2014.
  21. Z. Zhang, X. Kavousianos, K. Chakrabarty and Y. Tsiatouhas, “Static Power Reduction using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches,” ΙΕΕΕ Transactions on Very Large Scale Integration (VLSI) Systems, vol. 22, no. 1, pp. 13-26, 2014.
  22. V. Tenentes and X. Kavousianos, “High-Quality Statistical Test-Compression with Narrow ATE Interface”, in IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, 2013.
  23. S. Valadimas, Y. Tsiatouhas, A. Arapoyanni and P. Xarchakos, “Effective Timing Error Tolerance in Flip-Flop Based Core Designs,” Springer Journal of Electronic Testing: Theory and Applications, vol. 29, pp. 795-804. 2013.
  24. C. Efstathiou, Z. Owda and Y. Tsiatouhas, “New High Speed Multi-Output Carry Look-Ahead Adders,” ΙΕΕΕ Transactions on Circuits and Systems-II, vol. 60, no. 10, pp. 667-671, 2013.
  25. J. Liaperdos, A. Arapoyanni and Y. Tsiatouhas, “Adjustable RF Mixers’ Alternate Test Efficiency Optimization by the Reduction of Test Observables,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 32, no. 9, pp. 1383-1394, 2013.
  26. J. Liaperdos, A. Arapoyanni and Y. Tsiatouhas, “A Test and Calibration Strategy for Adjustable RF Circuits,” Springer, Analog Integrated Circuits and Signal Processing, vol. 74, no. 1, pp. 175-192, 2013.
  27. J. Liaperdos, A. Arapoyanni and Y. Tsiatouhas, “A Built-In Voltage Measurement Technique for the Calibration of RF Mixers,” IEEE Transactions on Instrumentation and Measurement, vol. 62, no. 4, pp. 732-742, 2013.
  28. X. Kavousianos, V. Tenentes, K. Chakrabarty, and M. Kalligeros, “Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets”, accepted for publication in IEEE Transactions on VLSI Systems, 2011.
  29. V. Tenentes, X. Kavousianos and E. Kalligeros, “Single and Variable State Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores”, IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 29, pp. 1640-1644, Oct. 2010.
  30. L. Dermentzoglou, A. Arapoyanni and Y. Tsiatouhas, “A Built-In-Test Circuit for RF Differential Low Noise Amplifiers,” IEEE Transactions on Circuits and Systems-I, vol. 57, no. 7, pp. 1549-1558, 2010.
  31. S. Matakias, Y. Tsiatouhas, Th. Haniotakis, and A. Arapoyanni, “A Current Mode, Parallel, Two-Rail Code Checker,” ΙΕΕΕ Transactions on Computers, vol. 57, no. 8, pp. 1032-1045, 2008.
  32. I. Fudos, X. Kavousianos, D. Markouzis and Y. Tsiatouhas, “Placement and Routing in Computer Aided Design of Standard Cell Arrays by Exploiting the Structure of the Interconnection Graph,” Computer-Aided Design and Applications, vol. 5, no. 1-4, pp. 325-337, 2008.
  33. Th. Haniotakis, Y. Tsiatouhas, D. Nikolos and C. Efstathiou, “Testable Designs of Multiple Precharged Domino Circuits,” ΙΕΕΕ Transactions on Very Large Scale Integration (VLSI) Systems, vol. 15, no. 4, pp. 461-465, 2007.
  34. Y. Tsiatouhas, “A Stress Relaxed Negative Voltage Level Converter,” ΙΕΕΕ Transactions on Circuits and Systems-II, vol. 54, no. 3, pp. 282-286, 2007.
  35. K. Limniotis, Y. Tsiatouhas, Th. Haniotakis and A. Arapoyanni, “A Design Technique for Energy Reduction in NORA CMOS Logic,” IEEE Transactions on Circuits and Systems-I, vol. 53, no. 12, pp. 2647-2655, 2006.

Κεφάλαια σε Βιβλία

  1. H-M. Dounavi, S. Sfikas and Y. Tsiatouhas, “Aging Monitors for SRAM Memory Cells and Sense Amplifiers,” Chapter in the Book: Ageing of Integrated Circuits: Causes, Effects and Mitigation Techniques, editor: Basel Halak, Springer, ISBN: 978-3-030-23780-6, 2020.
  2. J. Liaperdos, A. Arapoyanni and Y. Tsiatouhas, “Machine Learning in Alternate Testing of Integrated Circuits,” Chapter in the Book: Machine Learning Paradigms: Applications of Learning and Analytics in Intelligent Systems, editors: George A. Tsihrintzis, Maria Virvou, Lakhmi C. Jain, Springer, ISBN: 978-3-030-15627-5, 2019.
  3. V. Tenentes and X. Kavousianos “Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing”, Chapter in the Book: Designing Very Large Scale Integration Systems: Emerging Trends & Challenges, editors: N. Voros, A. Mukherjee, N. Sklavos, K. Masselos, M. Huebner, Springer, ISBN: -, 2011.
  4. A. Floros, Y. Tsiatouhas and X. Kavousianos, “Timing Error Detection and Correction by Time Dilation,” Chapter in the Book: VLSI-SoC: Design Methodologies for SoC and SiP, editors: C. Piguet, R. Reis, D. Soudris, Springer, ISBN: 978-3-642-12266-8, 2010.

Διεθνή Συνέδρια (με κρίση)

  1. Tenentes, Vasileios, Leech, Charles, Bragg, Graeme, Merrett, Geoffrey, Al-Hashimi, Bashir, Amrouch, Hussam, Henkel, Jörg and Das, Shidhartha (2017) Hardware and software innovations in energy-efficient system-reliability monitoring In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE. 5 pp.
  2. Gutierrez Alcala, Mauricio, Daniel, Tenentes, Vasileios, Kazmierski, Tomasz and Rossi, Daniele (2017) Low cost error monitoring for improved maintainability of IoT applications At IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. 23 – 25 Oct 2017. 6 pp.
  3. D. Gutierrez, Mauricio, Tenentes, Vasileios, Rossi, Daniele, Kazmierski, Tom J., Concurrent Detection of Systematic Errors for Low Power Non-safety Critical Applications, submitted to 22nd IEEE European Test Symposium (ETS), 2017
  4. Chahal, Hardeep, Tenentes, Vasileios, Rossi, Daniele and Al-Hashimi, Bashir M. (2016) BTI aware thermal management for reliable DVFS designs. In, Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFT’16), Connecticut, US, 19 – 20 Sep 2016. 6pp. (best paper award nominee)
  5. D. Gutierrez, Mauricio, Tenentes, Vasileios, Kazmierski, Tom J., (2016) Susceptible Workload driven Selective Fault Tolerance using a Probabilistic Fault Model, accepted at, 22nd IEEE International On-Line Testing Symposium, Spain, 04 – 06 Jul 2016. 6pp.
  6. Rossi, Daniele, Tenentes, Vasileios, Khursheed, Saqib and Al-Hashimi, Bashir M. (2015) BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. In, 21st IEEE International On-Line Testing Symposium, Halkidiki, Greece, 06 – 08 Jul 2015. 6pp.
  7. Tenentes, Vasileios, Rossi, Daniele, Khursheed, Saqib and Al-Hashimi, Bashir M. (2015) Diagnosis of power switches with power-distribution-network consideration. In, 20th IEEE European Test Symposium (ETS 2015), Cluj-Napoca, RO, 25 – 29 May 2015. 6pp.
  8. Rossi, Daniele, Tenentes, Vasileios, Khursheed, Saqib and Al-Hashimi, Bashir (2015) NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. In, IEEE European Test Symposium 2015, Cluj-Napoca, RO, 25 – 29 May 2015. 6pp.
  9. Tenentes, Vasileios, Khursheed, Syed Saqib, Al-Hashimi, Bashir M., Zhong, Shida and Yang, Sheng (2014) High quality testing of grid style power gating. In, 23rd Asian Test Symposium (ATS), Hangzhou, CN, 16 – 19 Nov 2014. 6pp.
  10. V. Tenentes and X. Kavousianos, “Test-Data Volume and Scan-Power Reduction with Low ATE Interface for Multi-Core SoCs”, IEEE/ACM International Conference on Computer-Aided Design (ICCAD), session 10B, San Jose, Nov. 2011
  11. V. Tenentes and X. Kavousianos, “Low Power Test-Compression for High Test-Quality and Low Test-Data Volume”, 20th IEEE Asian Test Symposium (ATS), session A2, New Delhi, Nov. 2011
  12. S. Balatsouka, V. Tenentes and X. Kavousianos and K. Chakrabarty, “Defect Aware X-Filling for Low-Power Scan Testing”, IEEE/ACM Design, Automation & Test in Europe (DATE) Conference, pp. 873-878, March 2010.
  13. V. Tenentes and X. Kavousianos, “Self-Freeze Linear Decompressors for Low Power Testing”, IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pp. 63-68, July 2010.
  14. X. Kavousianos, K. Chakrabarty, E. Kalligeros and V. Tenentes, “Defect coverage-driven window-based test compression”, 19th IEEE Asian Test Symposium (ATS), pp. 141-146, Dec. 2010.
  15. V. Tenentes, X. Kavousianos and E. Kalligeros, “Shrinking the Application Time of Test Set Embedding by Using Variable-State Skip LFSRs”, IEEE European Test Symposium(ETS), Inf. Digest., May 2008.
  16. V. Tenentes, X. Kavousianos and E. Kalligeros “State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores”, IEEE/ACM Design, Automation & Test in Europe (DATE) Conference, pp. 474-479, March 2008.

Διεθνή Εργαστήρια

  1. V. Tenentes and A. Papanikolaou “Interactive field-directed floorplan prototyping for 2D/3D IC’s ”, D43D: 4th Design for 3D Silicon Integration Workshop, June 25th-27th 2012, Lausanne.

Μονογραφές

Β. Τενέντες, Αρχιτεκτονικές Ενσωματωμένου Ελέγχου. 2013. Διδακτορική Διατριβή, Πανεπιστήμιο Ιωαννίνων.

Β. Τενέντες, Σχεδίαση Γραµµικών Ολισθητών µε Επιλεκτική Ανάδραση, 2007 . Μεταπτυχιακή Εργασία Εξειδίκευσης, Πανεπιστήμιο Ιωαννίνων.